JAN transistor and diode characterization test program: JANTX diode 1N759A

The necessary data to create a new class of specifications was the objective of this characterization program. Sample selection was made according to the following criteria: (1) manufacturer or qualified distributor; (2) two vendors; and (3) two date codes. The general guidelines for procurement were two QPL vendors, JAN or JANTX, and two manufacturing lots, 27 from each lot. All data were acquired with three digit accuracy. The data processing and calculation of statistical parameters were performed by the Tektronix computer system using 4 digit display.