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The use of an ion-beam source to alter the surface morphology of biological implant materialsAn electron bombardment, ion thruster was used as a neutralized-ion beam sputtering source to texture the surfaces of biological implant materials. Scanning electron microscopy was used to determine surface morphology changes of all materials after ion-texturing. Electron spectroscopy for chemical analysis was used to determine the effects of ion texturing on the surface chemical composition of some polymers. Liquid contact angle data were obtained for ion textured and untextured polymer samples. Results of tensile and fatigue tests of ion-textured metal alloys are presented. Preliminary data of tissue response to ion textured surfaces of some metals, polytetrafluoroethylene, alumina, and segmented polyurethane were obtained.
Document ID
19780014675
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Weigand, A. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1978
Subject Category
Life Sciences (General)
Report/Patent Number
E-9573
NASA-TM-78851
Report Number: E-9573
Report Number: NASA-TM-78851
Meeting Information
Meeting: Soc. for Biomater. Conf.
Location: San Antonio
Start Date: April 29, 1978
End Date: May 2, 1978
Accession Number
78N22618
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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