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Critical fault patterns determination in fault-tolerant computer systemsThe method proposed tries to enumerate all the critical fault-patterns (successive occurrences of failures) without analyzing every single possible fault. The conditions for the system to be operating in a given mode can be expressed in terms of the static states. Thus, one can find all the system states that correspond to a given critical mode of operation. The next step consists in analyzing the fault-detection mechanisms, the diagnosis algorithm and the process of switch control. From them, one can find all the possible system configurations that can result from a failure occurrence. Thus, one can list all the characteristics, with respect to detection, diagnosis, and switch control, that failures must have to constitute critical fault-patterns. Such an enumeration of the critical fault-patterns can be directly used to evaluate the overall system tolerance to failures. Present research is focused on how to efficiently make use of these system-level characteristics to enumerate all the failures that verify these characteristics.
Document ID
19780015853
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Mccluskey, E. J.
(Stanford Univ. CA, United States)
Losq, J.
(Stanford Univ. CA, United States)
Date Acquired
September 3, 2013
Publication Date
January 1, 1978
Subject Category
Computer Systems
Report/Patent Number
NASA-CR-145352
Accession Number
78N23796
Funding Number(s)
PROJECT: SEL PROJ. 24-77
OTHER: NSG-1410
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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