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Emittance of TD-NiCr after simulated reentryThe effects of simulated reentry heating on the emittance of TD-NiCr were investigated. Groups of specimens with three different preconditioning treatments were exposed to 6, 24, and 30 half-hour simulated reentry exposure cycles in a supersonic arc tunnel at each of three conditions intended to produce surface temperatures of 1255, 1365, and 1475 K. Emittance was determined at 1300 K on specimens which were preconditioned only and specimens after completion of reentry simulation exposure. Oxide morphology and chemistry were studied by scanning electron microscopy and X-ray diffraction analysis. A consistent relationship was established between oxide morphology and total normal emittance. Specimens with coarser textured oxides tended to have lower emittances than specimens with finer textured oxides.
Document ID
19780024287
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Clark, R. K.
(NASA Langley Research Center Hampton, VA, United States)
Dicus, D. L.
(NASA Langley Research Center Hampton, VA, United States)
Lisagor, W. B.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
September 1, 1978
Subject Category
Metallic Materials
Report/Patent Number
NASA-TM-78784
Report Number: NASA-TM-78784
Meeting Information
Meeting: Intern. Thermal Conductivity Conf.
Location: Ottawa
Start Date: August 24, 1977
End Date: August 26, 1977
Accession Number
78N32230
Funding Number(s)
PROJECT: RTOP 506-16-43-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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