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Transistor step stress testing program, JANTX 2N2905AThe effect of power and temperature stresses when applied to a variety of semiconductor devices is summarized.
Document ID
19780025398
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
September 3, 2013
Publication Date
June 1, 1978
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-150821
Report Number: NASA-CR-150821
Accession Number
78N33341
Funding Number(s)
CONTRACT_GRANT: NAS8-31944
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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