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The curved crystal X-ray spectrometer for the HEAO-B satelliteThe Focal Plane Crystal Spectrometer on HEAO-B is a moderate to high resolution, curved-crystal, Bragg spectrometer which operates behind a grazing incidence X-ray telescope. It is designed to allow detailed spectral studies of both point and extended celestial X-ray sources in the energy range 0.2-3.3 keV, with resolutions of 50 to 1000. The analyzing elements are six torroidal diffractors, and the detectors are position-sensitive, flow, proportional counters. HEAO-B is scheduled for launch in June, 1978.
Document ID
19780056355
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Canizares, C. R. (Massachusetts Inst. of Tech. Cambridge, MA, United States)
Clark, G. W. (Massachusetts Inst. of Tech. Cambridge, MA, United States)
Bardas, D. (Massachusetts Inst. of Tech. Cambridge, MA, United States)
Markert, T. (MIT Cambridge, Mass., United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1977
Subject Category
Astronomy
Meeting Information
Meeting: Seminar on X-ray imaging
Location: Reston, VA
Start Date: April 18, 1977
End Date: April 21, 1977
Accession Number
78A40264
Funding Number(s)
CONTRACT_GRANT: NAS8-30752
Distribution Limits
Public
Copyright
Other

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