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High resolution imaging X-ray detector for astronomical measurementsThe article describes the X-ray detector which will provide second-of-arc images for the HEAO-B X-ray observatory. The instrument uses microchannel plates as a photocathode surface and imaging photoelectron multiplier, and a crossed wire grid as a two-dimensional position-sensitive detector. Position determination is accomplished by electronic interpolation between the coarse grid wires. The detector provides the arrival time and position of each event which occurs within its field of view. Measurements of the spatial resolution (15 microns), temporal resolution (7.8 microsec), image distortion (less than 10 microns), uniformity of efficiency (less than plus or minus 10%), dark counting rate (0.2 cts/sq cm/s), and quantum efficiency (10% at 1.54 keV) of this detector are described. A summary of the procedure which was found useful during the initial turn-on of microchannel plates is given.
Document ID
19780056360
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Henry, J. P.
(American Science and Engineering, Inc. Cambridge, MA, United States)
Kellogg, E. M.
(American Science and Engineering, Inc. Cambridge, MA, United States)
Murray, S. S.
(American Science and Engineering, Inc. Cambridge, MA, United States)
Van Speybroeck, L. P.
(Harvard College Observatory and Smithsonian Astrophysical Observatory, Center for Astrophysics, Cambridge Mass., United States)
Bjorkholm, P. J.
(American Science and Engineering, Inc. Cambridge, Mass., United States)
Briel, U. G.
(American Science and Engineering, Inc. Cambridge, MA, United States)
Date Acquired
August 9, 2013
Publication Date
January 1, 1977
Subject Category
Spacecraft Instrumentation
Meeting Information
Meeting: Seminar on X-ray imaging
Location: Reston, VA
Start Date: April 18, 1977
End Date: April 21, 1977
Accession Number
78A40269
Funding Number(s)
CONTRACT_GRANT: NAS8-30751
Distribution Limits
Public
Copyright
Other

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