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Systematic errors in Hadamard transform opticsError sources encountered in Hadamard transform optical instruments are discussed. Such errors are caused by factors including moving masks, incorrect mask alignment, defects in mask fabrication, missing data, drifts in background level, and diffraction. Techniques for error reduction and/or elimination are described for each of the cases considered. It is noted that the errors described occur in singly encoded spectrometers and imagers.
Document ID
19780067182
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Sloane, N. J. A.
(Bell Telephone Laboratories, Inc. Murray Hill, N.J., United States)
Harwit, M.
(Cornell University Ithaca, N.Y., United States)
Tai, M.-H.
(NASA Langley Research Center Hampton, Va., United States)
Date Acquired
August 9, 2013
Publication Date
September 15, 1978
Publication Information
Publication: Applied Optics
Volume: 17
Subject Category
Instrumentation And Photography
Accession Number
78A51091
Funding Number(s)
CONTRACT_GRANT: NGR-33-010-210
CONTRACT_GRANT: NSG-1263
Distribution Limits
Public
Copyright
Other

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