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JANTX1N645-1 diodeSamples manufactured by Semtech were tested. Devices showed excessine reverse leakage currents during each of three test phases. Results of testing suggest that failures occurred because of static charge on surface of encapsulant, caused by thermal decomposition of paint.
Document ID
19790000456
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25243
Report Number: MFS-25243
ISSN: 0145-319X
Accession Number
79B10456
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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