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JANTX1N649-1 diodeSamples mamufactured by Semtech and Micro Semiconductor were tested. Both lots did quite well in tests. Plot showing cumulative failure distribution for group 2 was drawn for both lots. Graphs for groups 1 and 3 failures could not be drawn because of extremely low occurence.
Document ID
19790000457
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25344
Report Number: MFS-25344
ISSN: 0145-319X
Accession Number
79B10457
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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