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JANTX/N759A voltage regulating diodeDiodes manyfactured by Texas Instruments and Siemens performed well in group I testing. Failure analysis shows that group II testing is most detrimental to both sample lots. Same failure mode of excessive I(sub) R leakage can be clearly seen in group III testing.
Document ID
19790000459
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25246
Report Number: MFS-25246
ISSN: 0145-319X
Accession Number
79B10459
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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