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JANTX1N3893 diodeDiodes manufactured by Siemens and Motorola were tested. Testing of Motorola diodes was stopped in all 3 groups because 50% failure-rate limit was reached. Siemens lot endured more testing in groups 1 and 2 and completed testing on group 3. Failure analysis was performed for group 2 testing.
Document ID
19790000464
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25266
Report Number: MFS-25266
ISSN: 0145-319X
Accession Number
79B10464
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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