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JANTX1N5420 diodeTesting of sample lots from Unitrode and Micro Semiconductor had to be stopped in group 1 test because 50% failure rate limit was reached. Failure analysis was performed only for group 2 testing because of apparent failure mode.
Document ID
19790000468
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25272
Report Number: MFS-25272
ISSN: 0145-319X
Accession Number
79B10468
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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