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JANTX1N5554 switching diodeMicro Semiconductor and Semtech diodes were tested. In group 1 tests Micro Semiconductor and Semtech lot testing was stopped because of excess failure rate. Failure analysis was performed on group 1 and 3 because of apparent failure mode.
Document ID
19790000471
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25275
ISSN: 0145-319X
Report Number: MFS-25275
Accession Number
79B10471
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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