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JANTX1N5614 switching siodeDiode manufactured by Micro Semiconductor and Semtech were tested. Main failure mode was surface inversions caused by leakage of contaminants through cracks in glass. Most failures in groups 2 and 3 were visual.
Document ID
19790000472
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
June 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 4
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25276
Report Number: MFS-25276
ISSN: 0145-319X
Accession Number
79B10472
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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