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Surface roughness measuring systemSignificant height information of ocean waves, or peaks of rough terrain is obtained by compressing the radar signal over different widths of the available chirp or Doppler bandwidths, and cross-correlating one of these images with each of the others. Upon plotting a fixed (e.g., zero) component of the cross-correlation values as the spacing is increased over some empirically determined range, the system is calibrated. To measure height with the system, a spacing value is selected and a cross-correlation value is determined between two intensity images at a selected frequency spacing. The measured height is the slope of the cross-correlation value used. Both electronic and optical radar signal data compressors and cross-correlations are disclosed for implementation of the system.
Document ID
19790002220
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Jain, A.
(JPL)
Date Acquired
September 3, 2013
Publication Date
July 18, 1978
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-CASE-NPO-13862-1
Patent Number: US-PATENT-4,101,891
Patent Application Number: US-PATENT-APPL-SN-744577
Accession Number
79N10391
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-13862-1|US-PATENT-4,101,891
Patent Application
US-PATENT-APPL-SN-744577
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