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Accelerated/abbreviated test methods for predicting life of solar cell encapsulants to Jet Propulsion Laboratory California Institute of Technology for the encapsulation task of the low-cost solar array projectAn important principle is that encapsulants should be tested in a total array system allowing realistic interaction of components. Therefore, micromodule test specimens were fabricated with a variety of encapsulants, substrates, and types of circuitry. One common failure mode was corrosion of circuitry and solar cell metallization due to moisture penetration. Another was darkening and/or opacification of encapsulant. A test program plan was proposed. It includes multicondition accelerated exposure. Another method was hyperaccelerated photochemical exposure using a solar concentrator. It simulates 20 year of sunlight exposure in a short period of one to two weeks. The study was beneficial in identifying some cost effective encapsulants and array designs.
Document ID
19790004374
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Kolyer, J. M.
(Rockwell International Corp. Anaheim, CA, United States)
Date Acquired
September 3, 2013
Publication Date
April 30, 1978
Subject Category
Energy Production And Conversion
Report/Patent Number
NASA-CR-157944
DOE/JPL-954458-78/10
Report Number: NASA-CR-157944
Report Number: DOE/JPL-954458-78/10
Accession Number
79N12545
Funding Number(s)
CONTRACT_GRANT: JPL-954458
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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