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Development and evaluation of die and container materialsX = 0.75 Beta prime Sialon (a silicon aluminum oxynitride) and Sibeon (silicon beryllium oxynitride) are promising die materials. In sessile drop tests in contact with molten silicon, beryllium contamination was less than ppm and aluminum contamination 50 ppm. A shaping die of the Sialon material was successfully fabricated. Dry milling studies for the preparation of Si3N4-Al2O3-ALN mixtures were performed with butanol, acetic anhydride, oleic acid, and triethanolamine milling aids. Optimum mixing was achieved with 0.15 percent triethanolamine using a milling time of 8 hours. Preliminary evaluation of Sibeon materials indicates that they are more resistent to molten silicon attack than Sialon. Silicon contamination from the beryllium was less than aluminum contamination even though the aluminum impurity level in the Sibeon was only 450 to 1300 ppm. Work designed to produce an aluminum-free Sibeon is described.
Document ID
19790008200
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Wills, R. R.
(Battelle Columbus Labs. OH, United States)
Niesz, D. E.
(Battelle Columbus Labs. OH, United States)
Date Acquired
September 3, 2013
Publication Date
January 15, 1979
Subject Category
Energy Production And Conversion
Report/Patent Number
NASA-CR-158087
DOE/JPL-954876-79/1
QPR-5
Report Number: NASA-CR-158087
Report Number: DOE/JPL-954876-79/1
Report Number: QPR-5
Accession Number
79N16371
Funding Number(s)
CONTRACT_GRANT: JPL-954876
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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