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Diode step stress program, JANTX1N5614The reliability of switching diode JANTX1N5614 was tested. The effect of power/temperature step stress on the diode was determined. Control sample units were maintained for verification of the electrical parametric testing. Results are reported.
Document ID
19790009079
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
September 3, 2013
Publication Date
December 1, 1978
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NASA-CR-161091
Report Number: NASA-CR-161091
Accession Number
79N17250
Funding Number(s)
CONTRACT_GRANT: NAS8-31944
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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