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Transistor step stress program for JANTX2N2920Data on the effect of power/temperature step stress when applied to the dual transistor JANTX2N2920 manufactured by Fairchild and National Semiconductor are presented. Fifty one (51) samples from Fairchild and 44 from National Semiconductor were submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.
Document ID
19790010032
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
September 3, 2013
Publication Date
February 1, 1979
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-161124
Report Number: NASA-CR-161124
Accession Number
79N18203
Funding Number(s)
CONTRACT_GRANT: NAS8-31944
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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