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Acoustic sensor engineering evaluation test reportTwo types of one-inch diameter sound pressure level sensors, which are candidates for monitoring ambient noise in the shuttle orbiter crew compartment during rest periods, were exposed to temperature, passive humidity, and vibration. One unexposed sensor of each type served as a reference unit. Except for the humidity exposures, each of the three capacitive microphones was individually tested in sequence with the essential voltage power supply and preamplifier. One unit exibited anomalous characteristics after the humidity exposure but returned to normal after being dried in an oven at 115 deg for two hours. Except for the humidity exposures, each of the three piezoelectric microphones was individually tested with a laboratory type amplifier. Two apparent failures occurred during these tests. The diaphragm on one was found ruptured after the fourth cycle of the humidity test. A second sensor showed an anomaly after the random vibration tests at which time its sensitivity was consistent at about one-half its former value.
Document ID
19790013156
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Phillips, E. L., Jr.
(Lockheed Electronics Co. Houston, TX, United States)
Bronson, R. D.
(Lockheed Electronics Co. Houston, TX, United States)
Date Acquired
September 3, 2013
Publication Date
June 1, 1976
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-160151
LEC-8472
JSC-11159
Report Number: NASA-CR-160151
Report Number: LEC-8472
Report Number: JSC-11159
Accession Number
79N21327
Funding Number(s)
CONTRACT_GRANT: NAS9-12200
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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