NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Learning with imperfectly labeled patternsThe problem of learning in pattern recognition using imperfectly labeled patterns is considered. The performance of the Bayes and nearest neighbor classifiers with imperfect labels is discussed using a probabilistic model for the mislabeling of the training patterns. Schemes for training the classifier using both parametric and non parametric techniques are presented. Methods for the correction of imperfect labels were developed. To gain an understanding of the learning process, expressions are derived for success probability as a function of training time for a one dimensional increment error correction classifier with imperfect labels. Feature selection with imperfectly labeled patterns is described.
Document ID
19790016526
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Chittineni, C. B.
(Lockheed Electronics Co. Houston, TX, United States)
Date Acquired
September 4, 2013
Publication Date
April 1, 1979
Subject Category
Numerical Analysis
Report/Patent Number
JSC-14867
LEC-13068
NASA-CR-160183
Report Number: JSC-14867
Report Number: LEC-13068
Report Number: NASA-CR-160183
Accession Number
79N24697
Funding Number(s)
CONTRACT_GRANT: NAS9-15800
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available