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Metal-dielectric interactionsMetal direlectric surface interactions and dielectric films on metal substrates were investigated. Since interfacial interaction depends so heavily on the nature of the surfaces, analytical surface tools such as Auger emission spectroscopy, X-ray photoelectron spectroscopy and field ion microscopy were used to assist in surface and interfacial characterization. The results indicate that with metals contacting certain glasses in the clean state interfacial, bonding produces fractures in the glasses while when a film such as water is present, fractures occur in the metal near the interface. Friction forces were used to measure the interfacial bond strengths. Studies with metals contacting polymers using field ion microscopy revealed that strong bonding forces could develop being between a metal and polymer surface with polymer transferring to the metal surface in various ways depending upon the forces applied to the surface in contact. With the deposition of refractory carbides, silicides and borides onto metal and alloy substrates the presence of oxides at the interface or active gases in the deposition plasma were shown to alter interfacial properties and chemistry. Auger ion depth profile analysis indicated the chemical composition at the interface and this could be related to the mechanical, friction, and wear behavior of the coating.
Document ID
19790017024
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Buckley, D. H.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 4, 2013
Publication Date
January 1, 1979
Subject Category
Metallic Materials
Report/Patent Number
NASA-TM-79151
Report Number: NASA-TM-79151
Meeting Information
Meeting: Conf. on Electrical Insulation and Dielectric Phenonena
Location: Whitehaven, PA
Country: United States
Start Date: October 21, 1979
End Date: October 25, 1979
Sponsors: NRC
Accession Number
79N25195
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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