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Chemical vapor deposition reactorAn improved chemical vapor deposition reactor is characterized by a vapor deposition chamber configured to substantially eliminate non-uniformities in films deposited on substrates by control of gas flow and removing gas phase reaction materials from the chamber. Uniformity in the thickness of films is produced by having reactive gases injected through multiple jets which are placed at uniformally distributed locations. Gas phase reaction materials are removed through an exhaust chimney which is positioned above the centrally located, heated pad or platform on which substrates are placed. A baffle is situated above the heated platform below the mouth of the chimney to prevent downdraft dispersion and scattering of gas phase reactant materials.
Document ID
19790020082
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Chern, S. S.
(JPL)
Maserjian, J.
(JPL)
Date Acquired
September 3, 2013
Publication Date
July 5, 1977
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-704468
Patent Number: NASA-CASE-NPO-13650-1
Patent Number: US-PATENT-4,033,286
Accession Number
79N28253
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-13650-1|US-PATENT-4,033,286
Patent Application
US-PATENT-APPL-SN-704468
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