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Accelerated life testing effects on CMOS microcircuit characteristicsModifications and additions to the present process of making CMOS microcircuits which are designed to provide protective layers on the chip to guard against moisture and contaminants were investigated. High and low temperature Si3N4 protective layers were tested on the CMOS microcircuits and no conclusive improvements in device reliability characteristics were evidenced.
Document ID
19790021262
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
August 9, 2013
Publication Date
June 1, 1979
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-161282
Report Number: NASA-CR-161282
Accession Number
79N29433
Funding Number(s)
CONTRACT_GRANT: NAS8-31905
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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