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Electrical Evaluation of RCA MWS5501D Random Access Memory, Volume 2, Appendix aThe electrical characterization and qualification test results are presented for the RCA MWS5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. The address access time, address readout time, the data hold time, and the data setup time are some of the results surveyed.
Document ID
19790023784
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Klute, A.
(Hughes Aircraft Co. Culver City, CA, United States)
Date Acquired
September 3, 2013
Publication Date
June 1, 1979
Subject Category
Computer Operations And Hardware
Report/Patent Number
HAC-REF-E0752-VOL-2-APP-A
NASA-CR-162262
FR-79-76-915-VOL-2-APP-A
Report Number: HAC-REF-E0752-VOL-2-APP-A
Report Number: NASA-CR-162262
Report Number: FR-79-76-915-VOL-2-APP-A
Accession Number
79N31955
Funding Number(s)
CONTRACT_GRANT: JPL-954789
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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