NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Electrical Evaluation of RCA MWS5001D Random Access Memory, Volume 3, Appendix BThe electrical characterization and qualification test results are presented for the RCA MWS5001D random access memory. The tests included functional tests, AC and DC parametric tests, AC parametric worst-case pattern selection test, determination of worst-case transition for setup and hold times, and a series of schmoo plots. The test values for the output voltage, average input current, the supply current and the leakage current are presented.
Document ID
19790023785
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Klute, A.
(Hughes Aircraft Co. Culver City, CA, United States)
Date Acquired
September 3, 2013
Publication Date
June 1, 1979
Subject Category
Computer Operations And Hardware
Report/Patent Number
FR-79-76-915-VOL-3
NASA-CR-162263
HAC-REF-E0752-VOL-3
Report Number: FR-79-76-915-VOL-3
Report Number: NASA-CR-162263
Report Number: HAC-REF-E0752-VOL-3
Accession Number
79N31956
Funding Number(s)
CONTRACT_GRANT: JPL-954789
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available