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JANTX1N2970B zener diodeReport evaluates effects of power and temperature overstress on General Semi-conductor and Siemens devices. Excessive failure rates limited testing. Failure modes are described.
Document ID
19800000012
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
August 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25260
ISSN: 0145-319X
Report Number: MFS-25260
Accession Number
80B10012
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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