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JANTX1N2989B zener diodeReport evaluates effects of power and temperature overstress on General Semiconductor and Siemens devices. Mechanical disruption is prominent failure mode. Other failures are described.
Document ID
19800000013
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
August 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25261
ISSN: 0145-319X
Report Number: MFS-25261
Accession Number
80B10013
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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