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JANTX1N5622 diodeReport describes effects of power and temperature overstress on Semtech and Micro Semiconductor diodes. Semtech devices failed with excessive reverse bias leakage due to external paint. Micro Semiconductor diodes had reverse bias leakage failure due to damaged silicon.
Document ID
19800000016
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
August 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25280
Report Number: MFS-25280
ISSN: 0145-319X
Accession Number
80B10016
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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