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JANTX2N3637 transistorReport describes effects of power and temperature overstress on Transitron and Motorola devices. Transitron batches exceeded 50 percent failure in power overstress and 160 hour temperature stress. Design differences are evaluated.
Document ID
19800000027
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
August 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25264
Report Number: MFS-25264
ISSN: 0145-319X
Accession Number
80B10027
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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