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JANTX2N4856 field-effect transistorReport evaluates effects of power and temperature overstress on Teledyne and Texas Instruments devices. Temperature stress caused most failures for both manufacturers' lots. Failure modes are analyzed.
Document ID
19800000030
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
August 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
MFS-25269
Report Number: MFS-25269
ISSN: 0145-319X
Accession Number
80B10030
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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