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Model for MOS field-time-dependent breakdownQuantitative model for MOC breakdown is derived and correlated with experiments.
Document ID
19800000162
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Li, S. P. (Caltech)
Maserjian, J. (Caltech)
Prussin, S. (Caltech)
Date Acquired
August 10, 2013
Publication Date
September 1, 1980
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-14701
ISSN: 0145-319X
Report Number: NPO-14701
Accession Number
80B10162
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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