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Electronic depth micrometerDevice for measuring depth or thickness reads distance of penetration by small-diameter probe. It was developed specifically to measure thickness of wet (uncured) insulation applied to Space Shuttle structures; thin probes penetrate wet insulation to substrate, and reference surface on gage is then positioned against outer surface of insulation to measure its thickness. Gage is easy to use, even by workers wearing gloves or other protective clothing, and allows remote reading and recording of production data.
Document ID
19800000385
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Major, R. K.
(United Space Boosters, Inc.)
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 2
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
Report Number: KSC-11181
ISSN: 0145-319X
KSC-11181
Accession Number
80B10385
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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