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Integrated material-surface analyzerThese 10 surface-analysis tests can be run without breaking vacuum: secondary-ion mass spectroscopy, ion-scattering spectroscopy, electron-stimulated desorption, residual-gas analysis, auger electron spectroscopy, x-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, characteristic-electron energy-loss spectroscopy, scanning electron microscope, scanning low-energy electron probe. Quadruple mass spectrometer, used in first 4 tests, serves as electron transfer lens in last 6 tests.
Document ID
19800000388
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Grunthaner, F. J.
(Caltech)
Lewis, B. F.
(Caltech)
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
NPO-14702
Report Number: NPO-14702
ISSN: 0145-319X
Accession Number
80B10388
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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