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CADAT test pattern generatorCADAT test pattern generator (TPG) aids in checkout, fault detection, and fault isolation of complex digital circuits. Time and effort of manually generating digital test patterns can be major limiting factor in effectively utilizing automatic testing. This time and effort are reduced from several months to several days by TPG.
Document ID
19800000433
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Date Acquired
August 10, 2013
Publication Date
January 1, 1981
Publication Information
Publication: NASA Tech Briefs
Volume: 5
Issue: 3
ISSN: 0145-319X
Subject Category
Fabrication Technology
Report/Patent Number
Report Number: MFS-25066
ISSN: 0145-319X
MFS-25066
Accession Number
80B10433
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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