NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
High resolution threshold photoelectron spectroscopy by electron attachmentA system is provided for determining the stable energy levels of a species ion, of an atomic, molecular, or radical type, by application of ionizing energy of a predetermined level, such as through photoionization. The system adds a trapping gas to the gaseous species to provide a technique for detection of the energy levels. The electrons emitted from ionized species are captured by the trapping gas, only if the electrons have substantially zero kinetic energy. If the electrons have nearly zero energy, they are absorbed by the trapping gas to produce negative ions of the trapping gas that can be detected by a mass spectrometer. The applied energies (i.e. light frequencies) at which large quantities of trapping gas ions are detected, are the stable energy levels of the positive ion of the species. SF6 and CFCl3 have the narrowest acceptance bands, so that when they are used as the trapping gas, they bind electrons only when the electrons have very close to zero kinetic energy.
Document ID
19800006619
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Chutjian, A.
(JPL)
Ajello, J. M.
(JPL)
Date Acquired
September 4, 2013
Publication Date
June 19, 1979
Subject Category
Atomic And Molecular Physics
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-856466
Patent Number: NASA-CASE-NPO-14078-1
Patent Number: US-PATENT-4,158,775
Accession Number
80N14877
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-14078-1|US-PATENT-4,158,775
Patent Application
US-PATENT-APPL-SN-856466
No Preview Available