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Prediction of wheat phenological development: A state-of-the-art reviewThe merits and shortcomings of LACIE wheat development models are described. The effects of planting dates, spatial errors in the variables, and model forms on accuracy are discussed.
Document ID
19800007254
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Seeley, M. W. (Lockheed Electronics Co. Houston, Tex., United States)
Trenchard, M. H. (Lockheed Electronics Co. Houston, Tex., United States)
Phinney, D. E. (Lockheed Electronics Co. Houston, Tex., United States)
Baker, J. R. (NASA Lyndon B. Johnson Space Center Houston, TX, United States)
Stuff, R. G. (Fort Lewis Coll. Durango, Colo., United States)
Date Acquired
August 10, 2013
Publication Date
July 1, 1979
Publication Information
Publication: Proc. of Tech. Sessions, Vol. 1 and 2
Subject Category
Earth Resources And Remote Sensing
Accession Number
80N15514
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19800007188Collected WorksProceedings of Technical Sessions, Volumes 1 and 2: the LACIE Symposium
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