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A statistical test procedure for detecting multiple outliers in a data setThere are no author-identified significant results in this report.
Document ID
19800020291
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Chhikara, R. S. (Lockheed Electronics Co. Houston, TX, United States)
Feiveson, A. H. (Lockheed Electronics Co. Houston, TX, United States)
Date Acquired
September 4, 2013
Publication Date
November 1, 1978
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
NASA-CR-160599
E80-10195
LEC-12910
JSC-14594
Report Number: NASA-CR-160599
Report Number: E80-10195
Report Number: LEC-12910
Report Number: JSC-14594
Accession Number
80N28792
Funding Number(s)
CONTRACT_GRANT: NAS9-15200
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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