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Adherence of ion beam sputter deposited metal films on H-13 steelAn electron bombardment argon ion source was used to sputter deposit 17 different metal and metal oxide films ranging in thickness from 1 to 8 micrometers on H-13 steel substrates. The film adherence to the substrate surface was measured using a tensile test apparatus. Comparisons in bond strength were made between ion beam, ion plating, and RF deposited films. A protective coating to prevent heat checking in H-13 steel dies used for aluminum die casting was studied. The results of exposing the coated substrates to temperatures up to 700 degrees are presented.
Document ID
19800023021
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Mirtich, M. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 4, 2013
Publication Date
January 1, 1980
Subject Category
Metallic Materials
Report/Patent Number
NASA-TM-81585
E-562
Report Number: NASA-TM-81585
Report Number: E-562
Meeting Information
Meeting: Natl. Am. Vacuum Soc. Symp.
Location: Detroit
Start Date: October 14, 1980
End Date: October 17, 1980
Accession Number
80N31527
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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