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Multi-Parameter Yield Zone Model for Predicting Spectrum Crack GrowthA systematic technique is presented for modeling crack growth load interaction effects due to spectrum loading. The Multi-Parameter Yield Zone (MPYZ) model accounts for crack growth retardation, acceleration, and underload effects. The load interactions are attributed to the residual stress intensity due to the plastic deformation at the crack tip. Fatigue crack growth was predicted and compared with test data for a variety of spectrum loadings.
Document ID
19800025270
Acquisition Source
Headquarters
Document Type
Technical Memorandum (TM)
Authors
Johnson, W. S. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 4, 2013
Publication Date
September 1, 1980
Subject Category
Structural Mechanics
Report/Patent Number
NASA-TM-81890
Report Number: NASA-TM-81890
Accession Number
80N33778
Funding Number(s)
PROJECT: RTOP 506-53-53-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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