NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
A parametric model for multispectral scannersA set of test statistics are specified and the corresponding output quantities computed by the characteristic function. Two sets of classification accuracies, one at the input and one at the output are estimated. The scanner's instantaneous field of view is changed and the variation of the output classification performance is monitored.
Document ID
19800041411
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Mobasseri, B. G. (Purdue Univ. West Lafayette, IN, United States)
Mcgillem, C. D. (Purdue Univ. West Lafayette, IN, United States)
Anuta, P. E. (Purdue University West Lafayette, Ind., United States)
Date Acquired
August 10, 2013
Publication Date
January 1, 1979
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Machine processing of remotely sensed data
Location: West Lafayette, IN
Start Date: June 27, 1979
End Date: June 29, 1979
Accession Number
80A25581
Funding Number(s)
CONTRACT_GRANT: NAS9-14016
CONTRACT_GRANT: NAS9-15466
CONTRACT_GRANT: NAS9-14970
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available