The charge injection device /CID/ as a stellar tracking sensorA 128 x 128 element CID imager was operated in a simulated stellar trackling environment and evaluated for temporal and pattern noise and spectral response over a temperature range of -40 C to +25 C. The test devices were fabricated on long-lifetime bulk silicon material and utilized very thin upper-level polysilicon electrodes for enhanced spectral response. A standard microcomputer was used to generate all control signals and to collect and process performance data. The results of this program were used to predict the performance of a 400 x 400 CID array designed specifically for stellar-tracking.
Document ID
19800060471
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Burke, H. K. (General Electric Co. Schenectady, NY, United States)
Brown, D. M. (General Electric Co. Schenectady, NY, United States)
Grafinger, A. (General Electric Co. Schenectady, NY, United States)
Michon, G. J. (General Electric Co. Schenectady, NY, United States)
Tomlinson, H. W. (General Electric Co. Schenectady, NY, United States)
Vogelsong, T. L. (General Electric Co. Schenectady, NY, United States)
Wilson, R. (General Electric Co. Schenectady, N.Y., United States)