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Detecting Contamination With Photoelectron EmissionPhotoelectron emission from aluminum or epoxy-painted aluminum can be used to reveal presence and concentration of surface contaminants. Emission can be used to locate those parts of surface that are excessively contaminated and to which coatings cannot be reliably bonded. Cleaning can then be done on areas that most need it. Probe moves at rate of typically 1 ft/s (30 cm/s), speed slow enough to ensure sensitivity but fast enough to keep scanning time within reasonable limit.
Document ID
19810000313
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Smith, T.
(Rockwell International Corp.)
Date Acquired
August 11, 2013
Publication Date
December 1, 1982
Publication Information
Publication: NASA Tech Briefs
Volume: 6
Issue: 3
ISSN: 0145-319X
Subject Category
Mechanics
Report/Patent Number
ISSN: 0145-319X
Report Number: MFS-25619
MFS-25619
Accession Number
81B10313
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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