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FETSIM user's manual and exampleA batch program written in FORTRAN IV which does D.C. and transient analysis of MOS circuits is presented. Circuits employing N-MOS transistors and/or P-MOS transistors in either a bulk technology or an SOS technology, or almost any combination of R-C elements may be analyzed. The program requires as input data the complete circuit topology, device parameters, process parameters, and control parameters. The user can specify initial node conditions and the input pulse format. For example, pulse rise time, fall time, width and time between succeeding pulses are all independently controllable. The program contains a sophisticated mathematical model that can accurately handle either NMOS, P-MOS, Bulk or SOS devices. Sensitivity to process changes is maintained by requiring such process parameters as threshold voltage and doping level as program inputs.
Document ID
19810005710
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
September 4, 2013
Publication Date
August 1, 1978
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-150800
Report Number: NASA-CR-150800
Accession Number
81N14222
Funding Number(s)
CONTRACT_GRANT: NAS8-31325
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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