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Properties of various silicon oxide phases in thin filmsLayers of SiO2 with reproducible properties can be manufactured relatively easily today. In the case of SiO and Si2O3 layers, it is necessary to carefully check all of the manufacturing parameters for producing layers with reproducible properties. The properties of the layers in the case of SiO2 do conform to expectations. In the case of Si2O3 and SiO, they can be understood at least qualitatively. Additional interesting models are available for a quantitative understanding.
Document ID
19810007358
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ritter, E.
(NASA Headquarters Washington, DC United States)
Date Acquired
September 4, 2013
Publication Date
August 1, 1980
Subject Category
Solid-State Physics
Report/Patent Number
NASA-TM-75908
Report Number: NASA-TM-75908
Accession Number
81N15873
Funding Number(s)
CONTRACT_GRANT: NASW-3198
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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