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A study of trends and techniques for space base electronicsThe use of dry processing and alternate dielectrics for processing wafers is reported. A two dimensional modeling program was written for the simulation of short channel MOSFETs with nonuniform substrate doping. A key simplifying assumption used is that the majority carriers can be represented by a sheet charge at the silicon dioxide-silicon interface. In solving current continuity equation, the program does not converge. However, solving the two dimensional Poisson equation for the potential distribution was achieved. The status of other 2D MOSFET simulation programs are summarized.
Document ID
19810010870
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Trotter, J. D.
(Mississippi State Univ. Mississippi State, MS, United States)
Wade, T. E.
(Mississippi State Univ. Mississippi State, MS, United States)
Gassaway, J. D.
(Mississippi State Univ. Mississippi State, MS, United States)
Date Acquired
September 4, 2013
Publication Date
January 1, 1979
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-161278
MSU-EE-QUAR-79
Report Number: NASA-CR-161278
Report Number: MSU-EE-QUAR-79
Accession Number
81N19397
Funding Number(s)
CONTRACT_GRANT: NAS8-26749
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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