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Test of charge injection device, phase 1A computer-controlled automatic facility containing two interactive microprocessors, peripherals, and an optical bench was used to obtain device characteristics for use in evaluating CID's as the sensor element in a prospective star tracker application. Each of the ST-256 chips tested contains a 256 x 256 pixel element array with 65536 picture elements. Two ST-256 devices were tested at 20 C under light levels of 10%, 0.1%, and 0.01% saturation, and in darkness. The saturation level was established at 0.95 microwatts sq cm as measured by the radiometeric sensor. Two test runs under each condition were performed for each chip. Two complete sets of data for each of the devices were thus obtained. A separate data field was used to store the results of each test condition. Repetitive runs of a test condition were stored sequentially in the same file. Examination of the data using print-outs is shown in examples.
Document ID
19810012573
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Gradinger, A.
(General Electric Co. Philadelphia, PA, United States)
Sayles, M. B.
(General Electric Co. Philadelphia, PA, United States)
Peters, D.
(General Electric Co. Philadelphia, PA, United States)
Buckley, P.
(General Electric Co. Philadelphia, PA, United States)
Date Acquired
September 4, 2013
Publication Date
March 1, 1981
Subject Category
Ground Support Systems And Facilities (Space)
Report/Patent Number
NASA-CR-161701
Report Number: NASA-CR-161701
Accession Number
81N21102
Funding Number(s)
CONTRACT_GRANT: NAS8-33952
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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