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Transient upsets in microprocessor controllersThe modeling and analysis of transient faults in microprocessor based controllers are discussed. Such controllers typically consist of a microprocessor, read only memory storing and application program, random access memory for data storage, and input/output devices for external communications. The effects of transient faults on the performance of the controller are reviewed. An instruction level perspective of performance is taken which is the basis of a useful high level program state description of the microprocessor controller. A transition matrix is defined which determines the controller's response to transient fault arrivals.
Document ID
19810016769
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Glaser, R. E.
(Johns Hopkins Univ. Baltimore, MD, United States)
Masson, G. M.
(Johns Hopkins Univ. Baltimore, MD, United States)
Date Acquired
September 4, 2013
Publication Date
May 1, 1981
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-CR-165713
Report Number: NASA-CR-165713
Accession Number
81N25305
Funding Number(s)
CONTRACT_GRANT: NSG-1442
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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