NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Breakdown voltage of discrete capacitors under single-pulse conditionsFor electrostatic capacitors the breakdown voltage is inherently related to the properties of the dielectric, with the important parameters being the dielectric field strength which is related to the dielectric constant and the dielectric thickness. These are not necessarily related to the capacitance value and the rated voltage, but generally the larger values of capacitance have lower breakdown voltages. Foil and wet slug electrolytics can withstand conduction currents pulses without apparent damage (in either direction for foil types). For solid tantalums, damage occurs whenever the capacitor charges to the forming voltage.
Document ID
19810017844
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Domingos, H.
(Clarkson Coll. of Technology Potsdam, NY, United States)
Scaturro, J.
(Clarkson Coll. of Technology Potsdam, NY, United States)
Hayes, L.
(Clarkson Coll. of Technology Potsdam, NY, United States)
Date Acquired
August 11, 2013
Publication Date
June 1, 1981
Publication Information
Publication: NASA. Marshall Space Flight Center Capacitor Technol., Appl. and Reliability
Subject Category
Electronics And Electrical Engineering
Accession Number
81N26381
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available